Time domain reflectometry measurement instrument

ABSTRACT

A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.

CROSS-REFERENCE

This application claims priority on Ser. No. 60/089,756 filed Jun. 18,1998.

FIELD OF THE INVENTION

This invention relates to an apparatus and method utilizing time domainreflectometry for measuring the condition or characteristics of amaterial.

BACKGROUND OF THE INVENTION

Knowledge of level in industrial process tanks or vessels has long beenrequired for safe and cost-effective operation of plants. Manytechnologies exist for making level measurements. These includebuoyancy, capacitance, ultrasonic and microwave radar, to name a few.Recent advantages in micropower impulse radar (MIR), also known asultra-wide band (UWB) radar, in conjunction with advances in equivalenttime sampling (ETS), permit development of low power and low cost timedomain reflectometry (TDR) devices. Existing TDR devices are expensiveand often impractical for industrial level instrumentation.

In a TDR instrument, a very fast pulse with a rise time of 500picoseconds, or less, is propagated down a transmission line that servesas a probe in a vessel. The pulse is reflected by a discontinuity causedby a transition between two media. For level measurement, thattransition is typically where the air and the material to be measuredmeet. The amplitude of the reflected signal depends on the differencebetween the dielectrics of the two media. The dielectric of air is one,while the dielectric of water is about eighty. The larger the differencein dielectric, the larger the reflected signal.

McEwan, U.S. Pat. No. 5,345,471, and other related patents, describe atechnique to transmit and receive very fast pulses with simple, low costand low power electronics. More particularly, McEwan, U.S. Pat. No.5,609,059, describes a level sensor utilizing this technology. However,the device described therein is intended to be used for simplecommercial level applications, such as automobile engine fluid levels.It does not utilize the feature set, power consumption, and versatilityrequired for use in the industrial process environment. Other knowndevices utilize this technology for a two-wire transmitter using justtwo wires for both receiving power from the user and sending levelinformation to the user. However, these devices are analog deviceslimited in the ability to measure the level of extremely low dielectricmaterials, or materials that coat, clump or build up on the probe, overthe wide temperature extremes of industrial process level environments.They also have limited level range capability.

The present invention is directed to overcoming one or more of theproblems discussed above, in a novel and simple manner.

SUMMARY OF THE INVENTION

In accordance with the invention there is provided a TDR measurementinstrument including improved diagnostic and measurement features.

In accordance with one aspect of the invention, there is disclosed ameasurement instrument utilizing self diagnostics.

In accordance with another aspect of the invention, there is provided aTDR measurement instrument utilizing automated zoom scaling.

Broadly, there is disclosed herein a time domain reflectometrymeasurement instrument comprising a probe defining a transmission line.A pulse circuit is connected to the probe for generating pulses on thetransmission line and receiving reflected pulses returned on thetransmission line, the reflected pulses representing a characteristic ofa material being measured. An equivalent time sampling circuit isconnected to the pulse circuit for developing an equivalent timerepresentation of the reflected pulses over an expanded time scalewithin the region of interest. An automatic scale circuit is operativelyassociated with the sampling circuit for automatically selectinglocation and size of the region of interest corresponding tocharacteristics of the probe.

More particularly, the instrument uses a microprocessor that enablesadded functionality and capabilities. The electronics and probe aretested and calibrated at the factory. Installation and commissioning bythe user is simple. The user installs the probe. The transmitter isscrewed on the top of the probe. The user connects a standard shieldedtwisted pair electrical cable to the electronics. Power is applied andthe device immediately displays levels. A few simple parameters may needto be entered such as output characteristics and the process materialdielectric constant.

Further features and advantages of the invention will be readilyapparent from the specification and from the drawing.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a side elevation view of a measurement instrument inaccordance with the invention;

FIG. 2 is a block diagram of a control circuit for the instrument ofFIG. 1;

FIG. 3 is a timing diagram illustrating a return signal received by thecircuit of FIG. 2;

FIG. 4 is a flow diagram illustrating operation of a program by themicroprocessor of FIG. 2;

FIG. 5 is a block diagram of the ETS circuitry and MIR circuitry for thecontrol circuit of FIG. 2;

FIG. 6 is a sectional view of an alternative probe that can be used withthe instrument of FIG. 1 including a separation segment, and

FIG. 7 is a side view of the probe of FIG. 6.

DETAILED DESCRIPTION OF THE INVENTION

Referring to FIG. 1, a process instrument 20 according to the inventionis illustrated the process instrument 20 uses micropower impulse radar(MIR) in conjunction with equivalent time sampling (ETS) and ultra-wideband (UWB) transceivers for measuring level. Particularly, theinstrument 20 uses guided wave radar for sensing level. While theembodiment described herein relates to an MIR level sensing apparatus,various aspects of the invention may be used with other types of processinstruments for measuring various process parameters.

The process instrument 20 includes a control housing 22, a probe 24, anda connector 26 for connecting the probe 24 to the housing 22. The probe24 is typically mounted to a process vessel (not shown) using a threadedfitting 28. The housing 22 is then secured to the probe 24 as bythreading the connector 26 to the probe 24 and also to the housing 22.These components may be as generally described in Mulrooney et al., U.S.patent application Ser. No. 09/094,142, filed Jun. 9, 1998, thespecification of which is hereby incorporated by reference herein. Asdescribed therein, the probe 24 comprises a high frequency transmissionline which, when placed in a fluid, can be used to measure level of thefluid. Particularly, the probe 24 is controlled by electronics in thehousing 22 for determining level in the vessel.

Referring to FIG. 2, the electronics mounted in the housing 22 of FIG. 1are illustrated in block diagram form as a control circuit 30 connectedto the probe 24. The control circuit 30 includes a microprocessor 32connected to a suitable memory 34 (the combination forming a computer)and a display/pushbutton interface 36. The display/push button interface36 may be as generally described in the Mulrooney et al. applicationincorporated by reference herein, and is used for entering parameterswith a keypad and displaying user information. The memory 34 comprisesboth non-volatile memory for storing programs and calibrationparameters, as well as volatile memories used during level measurement,as described below.

The microprocessor 32 is also connected to digital to analoginput/output circuitry 38, which is in turn connected to two-wire 4-20mA circuitry 40 for connecting to remote devices as represented by aninput/output line 42. Particularly, the two-wire circuitry 40 utilizesloop control and power circuitry which is well known and commonly usedin process instrumentation. The power is provided on the line 42 from anexternal power supply. The circuitry 40 controls the current on thetwo-wire line 42 which represents level or other characteristicsmeasured by the probe 24.

The microprocessor 32 is also connected via logic and timing circuitry44 to an ETS circuit 46. The logic and timing circuitry 44 convertssignals to appropriate levels and coordinates timing of such signallevels. The ETS circuit 46 is connected via an MIR circuit 48 to theprobe 24. The ETS circuitry 46 and the MIR circuitry 48 are known andare generally in accordance with the teachings of McEwan, U.S. Pat. Nos.5,345,471 and 5,609,059, the specifications of which are herebyincorporated by reference herein. The MIR circuitry 48 generates veryfast pulses of 500 picoseconds or less rise time. The timing betweenpulses is tightly controlled. The reflected pulses are sampled atcontrolled intervals. The samples build a time multiplied “picture” ofthe reflected pulses. A typical picture is illustrated in FIG. 3. All ofthe pulses shown in FIG. 3 will not be present at the same time. A clumppulse occurs only when the material measured forms a clump on the probe.When a level pulse is present typically there is no end of probereflection. Since the pulses travel in the probe at the speed of light,this picture represents approximately ten nanoseconds in real time for afive-foot probe. The ETS circuitry 46 converts the time to about 71milliseconds. As is apparent, the exact time would depend on variousfactors, such as, for example, probe length. The largest signals have anamplitude of the order of 20 millivolts before amplification to thedesired amplitude by common audio amplifiers. For a low power device, athreshold scheme is employed to give timed interrupts to themicroprocessor 32 for each of the signals, namely, fiducial, clump,level, and end of probe, see FIG. 3. The microprocessor 32 convertsthese timed interrupts into distance. With the probe length enteredthrough the display/pushbutton interface 36, or some other interface,the microprocessor 32 can calculate the level by subtracting from theprobe length the difference between the fiducial and level distances.

In accordance with the invention, the known ETS circuitry 46 is modifiedto include digital control by microprocessor 32 of selected circuitparameters. Here, three digital potentiometers labeled DP1, DP2 and DP3receive digital commands, having one of 256 settings representingdesired resistance, from the microprocessor 32. The commanded resistancevaries operation of the ETS circuitry 46 for controlling the signal sentvia the logic and timing circuitry 44 to the microprocessor 32.

Prior art level transmitters primarily utilize analog potentiometeradjustments for various probe lengths, or may have a single setting forthe maximum probe length, relying on linearity of electronics to providelevel measurement with a shorter probe. These approaches limit accuracyand resolution of a level measurement. They also create difficultiesduring field servicing of the level transmitters. If electronics must bereplaced in the field, then all the calibrations and adjustments have tobe made there as well, which requires more highly qualified fieldpersonnel, special test equipment, and more time to perform suchprocedures. In accordance with the invention, electronic zoom scalingallows the device to overcome these shortcomings. Electronic zoomscaling combines versatility, stability and universality of analogpotentiometers with the capabilities of a microprocessor using thedigital potentiometers DP1 to DP3. The adjustments made by therespective digital potentiometers DP1, DP2, and DP3 are range, windowand gain.

Referring to FIG. 3, the curve illustrates the return signal received bythe ETS circuitry 46. The MIR circuitry 48 generates and transmits ameasurement pulse at some known time to the left of the amplitude axis.The returned fiducial signal is a reference signal based on a markerbuilt into the instrument 20. Typically, the fiducial is positioned atsome location along the probe, such as the top of the probe, higher thana highest level that can be sensed. The ETS circuitry 46 is configuredto look for a return signal only in a region of interest (ROI). A windowis defined as a time from when the pulse is transmitted to the beginningof the region of interest. The ETS circuitry 46 then looks for thereceived pulses only within the region of interest. The ETS circuitry 46also utilizes an adjustable range. The range represents the length ofthe ROI beyond the end of the window to look for return signals. Thefirst digital potentiometer DP1 is used to adjust the range. The seconddigital potentiometer DP2 is used to adjust the window. The range may beadjusted to include the fiducial signal and the end of probe signal.

The third potentiometer DP3 is used for the gain adjustment. The gainadjustment controls the amplitude of the return signal as will appearbelow. The amount of reflected energy depends on the dielectric of thematerial. The gain adjustment controls the amplitude of the analogsignal regardless of the media.

The window and range are influenced by the tolerances of the electroniccomponents of a given circuit board. This relationship is determinedduring the factory calibration of the electronics. The relevantcalibration parameters are stored in an onboard memory by factorypersonnel. If a board has to be replaced in the field, then a new one isinstalled and the pertinent setup parameters are entered. No additionalcalibration with test equipment, potentiometer adjustments, or levelmeasurement is necessary.

The proper combination of range and window adjustment, in accordancewith the invention, allows increased resolution and accuracy of levelmeasurements by “zooming in” on the ROI. Such ROI may be an interfacebetween air and liquid, or an interface between air and solids, or aninterface between two liquids, or any other area along the probe. Themicroprocessor 32 and digital potentiometers DP1-DP3 allow setting thelocation and size of the ROI and maintaining information about suchselection with respect to the overall distance.

There is considerable interest in level measurement of materials withextremely low dielectric constants. Jet fuel and kerosene have adielectric constant of the order of 1.7. Liquid nitrogen has adielectric constant of the order of 1.45. The dielectric constant varieswith temperature and with purity of the material. For these products,reflection coefficients are extremely small. By zooming in on a smallROI around the interface area, not only does the accuracy and resolutionof the measurement increase, but it also allows for a lower sweep andtherefore a larger number of pulses per inch. An increased number ofpulses per inch increases the signal to noise ratio without increasingpower consumption. Additionally, intentionally placed reference markers,or spacers, may be placed on the probe 24. This provides absolutedistance references which can be used to determine material level on theprobe.

Referring to FIG. 4, a flow diagram illustrates a program implemented inthe microprocessor 32 of FIG. 2 for level measurement. As discussedabove, the instrument 20 is factory calibrated. Particularly, thefactory adjusts a parameter referred to as “window offset” so that aknown marker in the probe 24, such as a fiducial, is located near thebeginning of the ROI. The window offset value is stored in permanentmemory for later recall. The factory then establishes a conversionfactor which is a time multiplication factor representing distance perunit time, such as inches per second. The conversion factor is alsostored in permanent memory. These calibrations reduce variations due tocomponent tolerances.

The operation of the program in the microprocessor 32 begins at a startnode 50. Thereafter, the window offset value is read from memory 34 at ablock 52. The conversion factor is read from the memory 34 at a block54. Using the display/pushbutton interface 36, the user enters the probetype, probe length and dielectric of the media at a block 56.Thereafter, the program enters an automatic setup routine forcontrolling further operation.

At a block 58 the program uses probe type and probe length informationto determine the location of markers intentionally designed into theprobe to provide known reference points. As described herein, theinstrument 20 uses two markers. However, the software can support anynumber of markers located at known points along the length of the probe24. The first is the fiducial at the top of the probe 24. The secondmarker is the end of probe 24. The end of probe 24 is an open circuitwhich generates a very high impedance. Calibration is done with nomaterial covering the probe. Calibration of scaling parameters such asscale offset minimizes temperature and time drift of other parameters.Calibration is also used to set up the region of interest by determiningthe window and range.

The software automatically adjusts range to cover the distance betweenthe two or more markers. This is done by either formulas or lookup tableusing empirically determined data at a block 60. The ETS circuitry 46 isupdated by writing the range value to the range digital potentiometerDP1. At a block 62, the program automatically adjusts a window adder sothat the desired marker is at the beginning of the ROI. A block 64calculates a window value. The window value is equal to the sum of thewindow offset, read at the block 52, and the window adder calculated atthe block 62. The ETS circuitry 46 is updated by writing the windowvalue to the window digital potentiometer DP2. The window adder isdetermined either by formula or look-up table.

At a block 66, the program adjusts the conversion factor and scaleoffset based on the value of range calculated at the block 60 and theprobe information entered by the user. This is also done either byformula or lookup table. Finally, a block 68 calculates the gain basedon the probe type and dielectric information entered by the user. Thisis done by formula or lookup table. The ETS circuitry 46 is updated bywriting the gain value to the gain digital potentiometer DP3.

Thereafter, a decision block 70 determines if it is necessary to returnto the setup routine. Normally, the setup routine, comprising the blocks52-68, is implemented only if a change is made by a user enteringparameters using the display/pushbutton interface 36 at the block 56.Otherwise, the program remains in the level measurement routine.

The level measurement routine begins at a block 72, where a pulse isgenerated. As is apparent, the generation of the pulse actually consistsof a repetitive pulse sequence using the ETS and MIR technologies. Adecision block 74 determines if there has been a fiducial pulse, asshown in FIG. 3. If the fiducial pulse is received, decision block 75determines if a return level pulse is received within the ROI after thefiducial. If so, then a block 76 determines level. This is done bymeasuring the time between the fiducial marker at the beginning of theROI and the reflection from the media. The time is multiplied by theconversion factor and added to the scale offset to obtain the distancefrom the top of the probe to an interface of dissimilar materials. Thelevel is the probe length minus the distance plus an offset, which isthe distance from the end of the probe to a predetermined referencepoint. The routine then returns to the decision block 70. The levelmeasurement routine is repeated unless the user has changed a parameter,in which event the setup routine is repeated.

If a return pulse is not received, as determined at the decision block75, then a self diagnostic routine is entered. Particularly, an expectedtime of flight is known between the fiducial and the end of probe. If nosignal is received within that time, then the instrument 20 is notoperating properly. A decision block 77 determines if an end of probesignal is detected within the expected time limit. If so, then thecontrol returns to the decision block 70 and the level measurementroutine is repeated unless the user has changed a parameter, in whichevent the setup routine is repeated.

If the fiducial signal or, in the absence of a level pulse, the end ofprobe signal is missing, an error condition is indicated at a block 78.An error message is given at display interface 36 and the current ontwo-wire line 42 is at an error level, e.g., less than 4 mA or more than20 mA. The control returns to block 70, as described above.

Thus, for normal operation, the instrument 20 continues to measure levelas long as the fiducial signal and a return level pulse or an end ofprobe pulse are received during an expected time period. However, when asetup parameter is changed, then the control returns to the setuproutine for adjusting the electronic zoom scaling parameters.

As discussed above, the ETS circuitry 46 is modified to include thedigital potentiometers DP1-DP3. Referring to FIG. 5, a block diagramillustrates the modified ETS circuitry 46 and the MIR circuitry 48 inblock diagram form.

A pulse repetition frequency (PRF) oscillator 83 is connected to atransmit pulse shaper 84 which is in turn connected to the probe 24. Theoscillator 83 is also connected to a pulse input of a voltage controlledpulse delay generator 85. Pulse outputs of the delay generator 85 andthe oscillator 83 are also connected to a time delay to voltageconverter 86. The output of the delay generator 85 is also connected toa receive pulse shaper 87 that is connected to a sampler 88. The sampler88 is connected to the probe. An output of the sampler 88 is connectedto a signal amplifier 89 which includes the gain digital potentiometerDP3. The signal amplifier 89 is in turn connected to a signal processingcircuit 90 which transfers the return pulse signal to the microprocessor32 of FIG. 2.

A sawtooth ramp generator 91 develops a sawtooth ramp as an input to asumming amplifier 92. The summing amplifier 92 is connected to the rangepotentiometer DP1 and the window potentiometer DP2. Range potentiometerDP1 sets gain, while Window potentiometer DP2 sets a DC offset appliedto the ramp signal from the ramp generator 91. The output of the summingamplifier 92 is supplied as an input to a difference amplifier 93. Theother input to the difference amplifier 93 is an output from the timedelay to voltage converter 86. These input signals representrespectively a desired delay and an actual delay. The output of thedifference amplifier is an error signal which is supplied to a controlvoltage input of the pulse delay generator 85.

The PRF oscillator 83 generates a pulse train at the frequency of thetransmitted pulses. For each input pulse, the pulse delay generator 85generates an output pulse with a delay that is controlled by its controlvoltage input. The delayed pulse passes through the receive pulse shaper87 and is provided to the sampler 88. The sampler 88 samples thereflected pulses from the probe 24 at a time determined by the delayedand shaped receive pulse. The resulting low frequency sampled signal isamplified and passed on to further signal processing circuits 89 and 90.The amplifier gain is controlled by the computer controlled gain digitalpotentiometer DP3.

The PRF oscillator signal and the delayed pulse also are inputs to thetime delay to voltage converter 86. The output of this converter 86 is avoltage proportional to the actual time delay between the transmit pulsefrom the PRF oscillator 83 and the receive pulse from the pulse delaygenerator 85. The voltage representing the measured delay is subtractedfrom a voltage representing the desired delay by the differenceamplifier 93. The difference amplifier 93 output is an error signal thatcontrols the time delay in the voltage controlled pulse delay generator85. This feedback loop measures the actual pulse delay, compares it tothe desired pulse delay, and forces the voltage controlled pulse delaygenerator 85 to adjust the actual pulse delay until it matches thedesired delay. In this way, most nonlinearities and drifts in thevoltage controlled pulse generator 85 have little or no effect on theactual pulse delay.

The voltage representing the desired delay is produced by the sawtoothramp generator 91 and the summing amplifier 92. The summing amplifieramplifies the sawtooth ramp signal and adds a DC offset to the resultingsignal. The DC offset voltage and the gain of the summing amplifier arecontrolled by the respective computer controlled digital potentiometersDP2 and DP1.

Automated control of the window (DC offset) and range (sawtooth rampgain) using potentiometers DP1 and DP2 allows the microprocessor 32 tocontrol the starting voltage and ending voltage of the sawtooth ramprepresenting the desired time delay, and therefore to control throughthe feedback loop the starting and ending time delay values actuallyapplied to the sampler 88. Controlling these time delays, in turn,controls the distance down the probe 24 that the scan begins and ends,allowing the microprocessor 32 to scan any small or large portion of theprobe as may be needed to easily identify a level reflection from theprobe 24. All spurious signals, as reflections occurring from locationsoutside the scanned interval, are not seen by the signal processingcircuits.

Microprocessor control of the gain potentiometer DP3 allows foradaptation to differing signal levels caused by differing dielectricconstants of the reflecting medium and for differing signal amplitudesresulting from differing probe configurations.

The probe 24 may be a coaxial probe including a signal conductorsurrounded by a ground sleeve. Such a coaxial probe and the cablesexhibit an impedance of approximately 50 ohms. Another type of probe isa twin rod probe. This type of probe has a mismatch, typically beyondthe fiducial. In accordance with the invention, a separation segment isused to provide impedance matching in the form of a gradual impedancechange from the fiducial to the twin lead line. This enables theinstrument to measure small dielectrics without interference fromcharacteristics of the probe itself.

Referring to FIG. 6, a twin rod probe 100 according to the invention isillustrated. The probe 100 includes mounting means, as a flange 102 orthread. A tubular fitting 104 extends outwardly from the flange 102. Thefitting 104 has an outer threaded end 106 and is shown with a cap 108.In use, the cap 108 is removed so the fitting can threadably receive theinstrument housing 22. A bushing 110 is welded to an inside of theflange 102 and has a through opening 111 coaxial with a flange opening109 and the fitting 104. A transmission line conductor 112 is centeredin the fitting 104 and bushing opening 111 with a spacer 114. A coaxialconnector 115 is provided at an outer end of the conductor 112. Aseparation sleeve 116 is connected inwardly of the bushing 110, coaxialwith and receiving the conductor 112. An additional Teflon spacer 118 isprovided in the separation sleeve 116.

The probe 100 also includes a signal line 120 and a ground line 122connected in parallel with spacers 124. The signal line 120 is securedto the conductor 112. The ground line 122 is fastened to the bushing110. In accordance with the invention, the probe 100 includes a fiducialsection 126 representing the area of the conductor 112 outwardly of thesignal line 120 and ground line 122, a separation segment 128, and alevel measuring segment 130. The level measuring segment 130 correspondsto location of of the signal line 120.

A coaxial cable (not shown) which is connected between the MIR circuitry48 and probe 100 has an impedance of 50 ohms. The center conductor ofthe coaxial cable is connected through connector 115 with conductor 112.Fiducial section 126 has an input impedance of 50 ohms, matching thecoaxial cable. Conductor 112 has a narrowed portion 134 within thefiducial section 126. This narrowed portion 134 has a greater spacingfrom flange 102 and bushing 110 than the remainder of conductor 112 andthus has a greater impedance, of the order of 75 ohms. The 25 ohmmismatch causes the fiducial return signal of FIG. 3. The outputimpedance of conductor 112, at the end of bushing 110, is also 50 ohms.

A coaxial probe (not shown) having an impedance of 50 ohms would matchthe impedance of fiducial section 126 and be connected directly to theend thereof. However, coaxial probes cannot be used in some conditions,as with the measurement of materials of high viscosity, which would tendto clog the space between the inner and outer conductors.

The twin rod probe shown in FIGS. 6 and 7 has a higher impedance thanthat of fiducial section 126, typically of the order of 150 ohms.Separation segment 128 provides an impedance match between fiducialsection 126 and level measuring segment 130. Separation sleeve 116surrounding conductor 112 beyond bushing 110 has an angled cut 132 whichprovides a gradual impedance change from 50 ohms to 150 ohms. Thisreduces reflections to the MIR circuitry 48 from the transition betweenconductor 112 and signal line 120. Teflon spacer 118 provides a stablemechanical connection between conductor 112 and signal line 120 andprevents liquids from entering fiducial section 126.

The control circuit 30 has the capability of digital communicationthrough the two-wire circuitry 40 and line 42 with remote devices andthe outside world. Such communication preferably uses the HART protocol.

Thus, in accordance with the invention, there is described a TDRmeasurement instrument which uses zoom scaling for improved measurement,self diagnostics, and improved probe design for certain applications.

We claim:
 1. A time domain reflectometry measurement instrumentcomprising: a probe defining a transmission line, the probe including afiducial at a near end, and a distal end; a pulse circuit connected tothe probe for generating pulses on the transmission line and receivingreflected pulses from the transmission line, the reflected pulsesrepresenting impedance changes on the transmission line; a time samplingcircuit connected to the pulse circuit for developing a timerepresentation of the reflected pulses; and a self diagnostic circuitcontrolling the pulse circuit and the time sampling circuit, the selfdiagnostic circuit indicating an error condition if no reflected pulseis received.
 2. The time domain reflectometry measurement instrument ofclaim 1 wherein the self diagnostic circuit indicates an error conditionif a first reflected pulse is received representing the fiducial and noreflected pulse is received representing a liquid level along the probeor the distal end.
 3. The time domain reflectometry measurementinstrument of claim 1 wherein the self diagnostic circuit stores a valuerepresenting distance between the fiducial and the distal end andindicates the error condition if a reflected pulse, is not received at atime representing the distance between the fiducial and the distal endafter a reflected pulse representing the fiducial.
 4. The time domainreflectometry measurement instrument of claim 1 wherein the selfdiagnostic circuit stores a value representing distance between thefiducial and the distal end and indicates the error condition if areflected pulse is not received prior to at time representing thedistance between the fiducial and the distal end after a reflected pulserepresenting the fiducial.
 5. The time domain reflectometry measurementinstrument of claim 1 wherein the self diagnostic circuit stores a valuerepresenting distance between the fiducial and the distal end andindicates the error condition if a reflected pulse, is not received at atime representing either a material along length of the probe or thedistance between the fiducial and the distal end after a reflected pulserepresenting the fiducial.
 6. The time domain reflectometry measurementinstrument of claim 1 wherein the self diagnostic circuit uses athreshold scheme to detect for reflected pulses.
 7. The time domainreflectometry measurement instrument of claim 6 wherein one of thereflected pulses comprises a fiducial pulse representing an impedancechange at said near end fiducial.
 8. The time domain reflectometrymeasurement instrument of claim 7 wherein the self diagnostic circuitindicates an error in condition if the fiducial pulse is not detectedusing said threshold scheme.
 9. A time domain reflectometry measurementinstrument comprising: a probe defining a transmission line including areference marker a pulse circuit connected to the probe for generatingpulses on the transmission line and receiving a reflected signal fromthe transmission line, the reflected signal selectively including afiducial pulse representing the reference marker and a further pulserepresenting material along the probe; a time sampling circuit connectedto the pulse circuit for developing a time representation of thereflected signal; and a control circuit controlling the pulse circuitand the time sampling circuit, the control circuit comprising thresholdmeans for detecting reflected pulses in the reflected signal andindicating an error condition if the threshold means does not detect anexpected fiducial pulse.
 10. The time domain reflectometry measurementinstrument of claim 9 wherein the threshold means further indicates anerror condition if no reflected pulse is detected after the expectedfiducial pulse is detected.
 11. A time domain reflectometry measurementinstrument composing: a probe defining a transmission line including areference marker; a pulse circuit connected to the probe for generatingpulses on the transmission line and receiving a reflected signal fromthe transmission line, the reflected signal selectively including afiducial pulse representing the reference marker and a further pulserepresenting material along the probe; a control circuit connected tothe pulse circuit for developing a time representation of the reflectedsignal and comprising a threshold detector for detecting reflectedpulses in the reflected signal and wherein the control circuit indicatesan error condition if the threshold detector does not detect an expectedfiducial pulse.
 12. The time domain reflectometry measurement instrumentof claim 11 wherein the control circuit further indicates an errorcondition if no reflected pulse is detected after the expected fiducialpulse is detected.
 13. The time domain reflectometry measurementinstrument of claim 11 wherein the control circuit comprise a programmedprocessor.
 14. The time domain reflectometry measurement instrument ofclaim 13 wherein the threshold detector sends an interrupt to theprogrammed processor for each detected reflected pulse.